发明申请
US20080007730A1 Microscope with higher resolution and method for increasing same
有权
显微镜具有更高的分辨率和增加方法
- 专利标题: Microscope with higher resolution and method for increasing same
- 专利标题(中): 显微镜具有更高的分辨率和增加方法
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申请号: US11806459申请日: 2007-05-31
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公开(公告)号: US20080007730A1公开(公告)日: 2008-01-10
- 发明人: Michael Kempe
- 申请人: Michael Kempe
- 优先权: DE102006026204.2 20060531
- 主分类号: G01J3/30
- IPC分类号: G01J3/30
摘要:
Microscope with higher resolution with partial spatial superposition in the illumination by an excitation beam and a de-excitation beam and/or a switching beam in a fluorescing sample, whereby the light from the sample is deflected, whereby, in the excitation beam and/or in the de-excitation and/or the switching beam, at least one combination of devices exercising circular and radial influence on the spatial phase is provided.
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