发明申请
US20080014725A1 DEPOSITION OVER MIXED SUBSTRATES USING TRISILANE 有权
使用TRISILANE的混合基板上的沉积

  • 专利标题: DEPOSITION OVER MIXED SUBSTRATES USING TRISILANE
  • 专利标题(中): 使用TRISILANE的混合基板上的沉积
  • 申请号: US11843552
    申请日: 2007-08-22
  • 公开(公告)号: US20080014725A1
    公开(公告)日: 2008-01-17
  • 发明人: Michael Todd
  • 申请人: Michael Todd
  • 申请人地址: US AZ Phoenix 85034-7200
  • 专利权人: ASM AMERICA, INC.
  • 当前专利权人: ASM AMERICA, INC.
  • 当前专利权人地址: US AZ Phoenix 85034-7200
  • 主分类号: H01L21/20
  • IPC分类号: H01L21/20
DEPOSITION OVER MIXED SUBSTRATES USING TRISILANE
摘要:
Trisilane is used in chemical vapor deposition methods to deposit silicon-containing films over mixed substrates. Such methods are useful in semiconductor manufacturing to provide a variety of advantages, including uniform deposition over heterogeneous surfaces, high deposition rates, and higher manufacturing productivity. An example is in forming the base region of a heterojunction bipolar transistor, including simultaneous deposition over both single crystal semiconductor surfaces and amorphous insulating regions.
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