发明申请
- 专利标题： Set Top Calibration Patterns in Manufacturing
- 专利标题（中）： 在制造中设置顶级校准模式
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申请号： US11427742申请日： 2006-06-29
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公开(公告)号： US20080022338A1公开(公告)日： 2008-01-24
- 发明人: Leo Montreuil , Wayne B. Williams , Samuel H. Russ , Robert A. Kriete
- 申请人： Leo Montreuil , Wayne B. Williams , Samuel H. Russ , Robert A. Kriete
- 申请人地址： US GA Lawrenceville
- 专利权人： SCIENTIFIC-ATLANTA, INC.
- 当前专利权人： SCIENTIFIC-ATLANTA, INC.
- 当前专利权人地址： US GA Lawrenceville
- 主分类号： H04N7/173
- IPC分类号： H04N7/173 ; H04N7/16
摘要：
Included are systems and methods for testing functionality of a set top terminal (STT). At least one embodiment of a method includes retrieving a test pattern from a storage device, the test pattern being configured to facilitate testing of at least one component of the STT, decoding the retrieved test pattern, and converting the decoded test pattern to at least one analog signal.
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