Invention Application
US20080034270A1 Semiconductor memory device capable of changing ECC code length
有权
能够改变ECC码长度的半导体存储器件
- Patent Title: Semiconductor memory device capable of changing ECC code length
- Patent Title (中): 能够改变ECC码长度的半导体存储器件
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Application No.: US11878867Application Date: 2007-07-27
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Publication No.: US20080034270A1Publication Date: 2008-02-07
- Inventor: Yasuhiro Onishi , Toshiya Miyo
- Applicant: Yasuhiro Onishi , Toshiya Miyo
- Assignee: Fujitsu Limited
- Current Assignee: Fujitsu Limited
- Priority: JP2006-214080 20060807
- Main IPC: G06F11/10
- IPC: G06F11/10

Abstract:
The data memory cell array and parity memory cell array in the memory cell array has a constitution that is capable of corresponding with a plurality of ECC code lengths. An input-side parity generation circuit that generates parities from write data, an output-side parity generation circuit that generates parities from read data, and a syndrome generation circuit that generates a syndrome bit that indicates an error bit from the read parity bits and generated parity bits are constituted so as to be capable of switching, according to the plurality of ECC code lengths.
Public/Granted literature
- US08001450B2 Semiconductor memory device capable of changing ECC code length Public/Granted day:2011-08-16
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