发明申请
- 专利标题: Image sensor ADC and CDS per Column with Oversampling
- 专利标题(中): 图像传感器ADC和CDS每列过采样
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申请号: US11974813申请日: 2007-10-16
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公开(公告)号: US20080043128A1公开(公告)日: 2008-02-21
- 发明人: Thomas Poonnen , Jeffrey Zarnowski , Li Liu , Michael Joyner , Ketan Karia
- 申请人: Thomas Poonnen , Jeffrey Zarnowski , Li Liu , Michael Joyner , Ketan Karia
- 专利权人: Panavision Imaging, LLC.
- 当前专利权人: Panavision Imaging, LLC.
- 主分类号: H04N5/335
- IPC分类号: H04N5/335
摘要:
A solid state imager converts analog pixel values to digital form on an arrayed per-column basis. An N-bit counter supplies an N-bit DAC to produce an analog ramp output with a level that varies corresponding to the contents of the counter. A latch/counter or equivalent is associated with each respective column. A clock supplies clock signal(s) to the counter elements. When the analog ramp equals the pixel value for that column, the latch/counter latches the value. The black level can be pre-set in the latch/counter or can be subtracted separately to reduce fixed pattern noise. The pixels can be oversampled for some number of times, e.g., n=16, to reduce the thermal noise of the sensors. Also, two or more pixels sharing a common sense node may be binned together, and two (or more) pixels having different integration times may be combined to obtain an output signal with enhanced dynamic range.
公开/授权文献
- US08169517B2 Image sensor ADC and CDS per column with oversampling 公开/授权日:2012-05-01