Invention Application
- Patent Title: Probe for testing a device under test
-
Application No.: US11977324Application Date: 2007-10-24
-
Publication No.: US20080048692A1Publication Date: 2008-02-28
- Inventor: K. Gleason , Tim Lesher , Eric Strid , Mike Andrews , John Martin , John Dunklee , Leonard Hayden , Amr Safwat
- Applicant: K. Gleason , Tim Lesher , Eric Strid , Mike Andrews , John Martin , John Dunklee , Leonard Hayden , Amr Safwat
- Assignee: Cascade Microtech, Inc.
- Current Assignee: Cascade Microtech, Inc.
- Main IPC: G01R1/067
- IPC: G01R1/067
Abstract:
A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.
Public/Granted literature
- US07436194B2 Shielded probe with low contact resistance for testing a device under test Public/Granted day:2008-10-14
Information query
