发明申请
US20080054297A1 ELECTROSTATIC DISCHARGE PROTECTION CIRCUIT USING A DOUBLE-TRIGGERED SILICON CONTROLLING RECTIFIER 失效
使用双触发硅控制整流器的静电放电保护电路

  • 专利标题: ELECTROSTATIC DISCHARGE PROTECTION CIRCUIT USING A DOUBLE-TRIGGERED SILICON CONTROLLING RECTIFIER
  • 专利标题(中): 使用双触发硅控制整流器的静电放电保护电路
  • 申请号: US11306212
    申请日: 2005-12-20
  • 公开(公告)号: US20080054297A1
    公开(公告)日: 2008-03-06
  • 发明人: Ming-Dou KerKuo-Chun Hsu
  • 申请人: Ming-Dou KerKuo-Chun Hsu
  • 优先权: TW92135908 20031218
  • 主分类号: H01L23/58
  • IPC分类号: H01L23/58
ELECTROSTATIC DISCHARGE PROTECTION CIRCUIT USING A DOUBLE-TRIGGERED SILICON CONTROLLING RECTIFIER
摘要:
An ESD protection circuit using a double-triggered silicon controller rectifier (SCR). The double-triggered silicon controller rectifier (SCR) includes N+ diffusion areas, P+ diffusion areas, a first N-well region, a second N-well region and a third N-well region formed in a P-substrate. The N+ diffusion areas and the P+ diffusion areas are isolated by shallow trench isolation (STI) structures. Two of the N+ diffusion areas are N-type trigger terminals. Two of the P+ diffusion areas are the P-type trigger terminal.
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