发明申请
- 专利标题： Process for Minimizing Electromigration in an Electronic Device
- 专利标题（中）： 电子设备中电迁移最小化的过程
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申请号： US11883992申请日： 2006-05-09
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公开(公告)号： US20080054806A1公开(公告)日： 2008-03-06
- 发明人: Khristopher Alvarez , Nick Shephard , James Tonge
- 申请人： Khristopher Alvarez , Nick Shephard , James Tonge
- 国际申请： PCT/US06/17718 WO 20060509
- 主分类号： H01J17/49
- IPC分类号： H01J17/49 ; C23C18/00
摘要：
A process for reducing Ag electromigration in electronic circuitry includes the step of treating the electronic circuitry with an electromigration resistant composition. This process is useful in fabricating electronic devices having electronic circuitry that is close together, such as resistors, capacitors, and displays, e.g., a plasma display panel (PDP) or a liquid crystal display (LCD).