Invention Application
US20080059110A1 Semiconductor integrated circuit supplying temperature signal as digital value
审中-公开
半导体集成电路提供温度信号作为数字值
- Patent Title: Semiconductor integrated circuit supplying temperature signal as digital value
- Patent Title (中): 半导体集成电路提供温度信号作为数字值
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Application No.: US11896295Application Date: 2007-08-30
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Publication No.: US20080059110A1Publication Date: 2008-03-06
- Inventor: Hiroki Fujisawa , Hitoshi Tanaka , Atsuo Koshizuka
- Applicant: Hiroki Fujisawa , Hitoshi Tanaka , Atsuo Koshizuka
- Applicant Address: JP Tokyo
- Assignee: ELPIDA MEMORY, INC.
- Current Assignee: ELPIDA MEMORY, INC.
- Current Assignee Address: JP Tokyo
- Priority: JP2006-234922 20060831
- Main IPC: G01K1/00
- IPC: G01K1/00

Abstract:
A semiconductor integrated circuit includes a temperature detecting unit that detects the temperature of a chip, and an A/D converter that converts an analog output VBE from the temperature detecting unit into a digital output. The A/D converter includes an up/down counter, a D/A converter that converts an output T2 from the up/down counter into an analog output, and a comparator that compares the analog output DAC_OUT of the D/A converter and the analog output VBE (VTEMP) of the temperature detecting unit. The up/down counter is adapted to be able to preset an initial value that is different from the minimum value or the maximum value. Accordingly, the determination time required at the initial conversion can be reduced although the linear search method is used.
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