发明申请
US20080061800A1 METHODS AND SYSTEMS FOR SIGMA DELTA CAPACITANCE MEASURING USING SHARED COMPONENT 有权
使用共享组件的SIGMA DELTA电容测量的方法和系统

METHODS AND SYSTEMS FOR SIGMA DELTA CAPACITANCE MEASURING USING SHARED COMPONENT
摘要:
Methods, systems and devices are described for detecting a measurable capacitance using sigma-delta charge transfer techniques that can be implemented with many standard microcontrollers, and can share components to reduce device complexity and improve performance. In the various implementations of this embodiment, the passive network used to accumulate charge can be shared between multiple measurable capacitances. A switch or IO controlling the charge sharing and/or charge changing can also be shared Likewise, in various implementations a voltage conditioning circuit configured to provide a variable reference voltage can be shared between multiple measurable capacitances. Finally, in various implementations a guarding electrode configured to guard the measurable capacitances can be shared between multiple measurable capacitances. In each of these cases, sharing components can reduce device complexity and improve performance.
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