发明申请
US20080061800A1 METHODS AND SYSTEMS FOR SIGMA DELTA CAPACITANCE MEASURING USING SHARED COMPONENT
有权
使用共享组件的SIGMA DELTA电容测量的方法和系统
- 专利标题: METHODS AND SYSTEMS FOR SIGMA DELTA CAPACITANCE MEASURING USING SHARED COMPONENT
- 专利标题(中): 使用共享组件的SIGMA DELTA电容测量的方法和系统
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申请号: US11925541申请日: 2007-10-26
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公开(公告)号: US20080061800A1公开(公告)日: 2008-03-13
- 发明人: Joseph Reynolds , Kirk Hargreaves
- 申请人: Joseph Reynolds , Kirk Hargreaves
- 申请人地址: US CA Santa Clara 95054
- 专利权人: SYNAPTICS INCORPORATED
- 当前专利权人: SYNAPTICS INCORPORATED
- 当前专利权人地址: US CA Santa Clara 95054
- 主分类号: G01R27/26
- IPC分类号: G01R27/26
摘要:
Methods, systems and devices are described for detecting a measurable capacitance using sigma-delta charge transfer techniques that can be implemented with many standard microcontrollers, and can share components to reduce device complexity and improve performance. In the various implementations of this embodiment, the passive network used to accumulate charge can be shared between multiple measurable capacitances. A switch or IO controlling the charge sharing and/or charge changing can also be shared Likewise, in various implementations a voltage conditioning circuit configured to provide a variable reference voltage can be shared between multiple measurable capacitances. Finally, in various implementations a guarding electrode configured to guard the measurable capacitances can be shared between multiple measurable capacitances. In each of these cases, sharing components can reduce device complexity and improve performance.
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