Invention Application
US20080064981A1 METHOD AND APPARATUS FOR DETERMINING ELECTRICAL PROPERTIES OF OBJECTS CONTAINING INHOMOGENEITIES 审中-公开
用于确定含有不均匀性的物体的电学性质的方法和装置

  • Patent Title: METHOD AND APPARATUS FOR DETERMINING ELECTRICAL PROPERTIES OF OBJECTS CONTAINING INHOMOGENEITIES
  • Patent Title (中): 用于确定含有不均匀性的物体的电学性质的方法和装置
  • Application No.: US11857493
    Application Date: 2007-09-19
  • Publication No.: US20080064981A1
    Publication Date: 2008-03-13
  • Inventor: Christopher Gregory
  • Applicant: Christopher Gregory
  • Main IPC: A61B5/053
  • IPC: A61B5/053
METHOD AND APPARATUS FOR DETERMINING ELECTRICAL PROPERTIES OF OBJECTS CONTAINING INHOMOGENEITIES
Abstract:
An electrical parameter imaging apparatus and method includes the acquisition of a charge distribution pattern on an array of electrodes that surround an object being imaged. In addition the boundaries of regions having differing electrical characteristics within the object are measured by a secondary imaging method. The internal boundary location measurements are employed to provide a quicker method to compute electrical parameters of tissues inside the boundary using the acquired charge distribution pattern.
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