Invention Application
- Patent Title: Statistical Surface-Scanning Method And System
- Patent Title (中): 统计表面扫描方法与系统
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Application No.: US10578220Application Date: 2004-10-19
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Publication No.: US20080065347A1Publication Date: 2008-03-13
- Inventor: Erwann Lavarec , Frederic Vautard
- Applicant: Erwann Lavarec , Frederic Vautard
- Priority: FR0350777 20031103
- International Application: PCT/FR04/50515 WO 20041019
- Main IPC: G01B11/00
- IPC: G01B11/00

Abstract:
The invention relates to a method of scanning a complex surface (202) defined at least partially by a physical barrier and/or comprising obstacles. The inventive method comprises the following steps: (a) a step consisting in sufficiently scanning a first zone such as to obtain absolute location data in said zone, thereby enabling same to be exhaustively scanned; (b) a step consisting in selecting a second zone (206i+1) of the complex surface, having a reduced size and a suitable shape, and repeating step (a) for said second zone; and (c) a step consisting in repeating step (b) as many times as is necessary for the whole complex surface to be scanned.
Information query