Invention Application
US20080065347A1 Statistical Surface-Scanning Method And System 审中-公开
统计表面扫描方法与系统

  • Patent Title: Statistical Surface-Scanning Method And System
  • Patent Title (中): 统计表面扫描方法与系统
  • Application No.: US10578220
    Application Date: 2004-10-19
  • Publication No.: US20080065347A1
    Publication Date: 2008-03-13
  • Inventor: Erwann LavarecFrederic Vautard
  • Applicant: Erwann LavarecFrederic Vautard
  • Priority: FR0350777 20031103
  • International Application: PCT/FR04/50515 WO 20041019
  • Main IPC: G01B11/00
  • IPC: G01B11/00
Statistical Surface-Scanning Method And System
Abstract:
The invention relates to a method of scanning a complex surface (202) defined at least partially by a physical barrier and/or comprising obstacles. The inventive method comprises the following steps: (a) a step consisting in sufficiently scanning a first zone such as to obtain absolute location data in said zone, thereby enabling same to be exhaustively scanned; (b) a step consisting in selecting a second zone (206i+1) of the complex surface, having a reduced size and a suitable shape, and repeating step (a) for said second zone; and (c) a step consisting in repeating step (b) as many times as is necessary for the whole complex surface to be scanned.
Information query
Patent Agency Ranking
0/0