发明申请
US20080068108A1 Systems and methods for detecting capacitor process variation 有权
检测电容器工艺变化的系统和方法

Systems and methods for detecting capacitor process variation
摘要:
A method for detecting capacitor variation in a device comprises operating an oscillator in the device, the oscillator being an Inductive-Capacitive (LC) oscillator and including an inductor of known value and a capacitor under test, comparing an output of the oscillator to a reference output, and evaluating variation for a plurality of capacitors in the device based on the comparing.
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