Invention Application
- Patent Title: METHOD OF PROCESSING DEFECT DETECTION SIGNAL IN RECORDING AND/OR REPRODUCING APPARATUS THAT RECORDS AND/OR REPRODUCES OPTICAL INFORMATION STORAGE MEDIUM
- Patent Title (中): 记录和/或再现记录和/或复制光信息存储介质的缺陷检测信号的处理方法
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Application No.: US11693168Application Date: 2007-03-29
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Publication No.: US20080068941A1Publication Date: 2008-03-20
- Inventor: Jong-hyun Shin , Tatsuhiro Otsuka , Kwan-joon Kim , Young-jae Park
- Applicant: Jong-hyun Shin , Tatsuhiro Otsuka , Kwan-joon Kim , Young-jae Park
- Applicant Address: KR Suwon-si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si
- Priority: KR2006-89247 20060914
- Main IPC: G11B7/00
- IPC: G11B7/00

Abstract:
A method of processing a defect detection signal in a recording and/or reproducing apparatus that records and/or reproduces an optical information storage medium the method including generating a defect detection signal comprising a servo hold pulse from a radio frequency (RF) signal output from an optical pickup unit; and generating an OR signal by performing an OR operation on the defect detection signal and a first pulse signal having a first pulse width. The method further includes generating an AND signal by performing an AND operation on the OR signal and a second pulse signal having a second pulse width.
Information query
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