发明申请
US20080072111A1 Method for performing a test case with a LBIST engine on an integrated circuit, integrated circuit and method for specifying an integrated circuit
失效
在集成电路上使用LBIST引擎执行测试用例的方法，用于指定集成电路的集成电路和方法
- 专利标题： Method for performing a test case with a LBIST engine on an integrated circuit, integrated circuit and method for specifying an integrated circuit
- 专利标题（中）： 在集成电路上使用LBIST引擎执行测试用例的方法，用于指定集成电路的集成电路和方法
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申请号： US11855505申请日： 2007-09-14
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公开(公告)号： US20080072111A1公开(公告)日： 2008-03-20
- 发明人: Thuyen Le , Thomas Pflueger , Martin Padeffke , Stefan Bonsels
- 申请人： Thuyen Le , Thomas Pflueger , Martin Padeffke , Stefan Bonsels
- 申请人地址： US NY Armonk
- 专利权人： INTERNATIONAL BUSINESS MACHINES CORPORATION
- 当前专利权人： INTERNATIONAL BUSINESS MACHINES CORPORATION
- 当前专利权人地址： US NY Armonk
- 优先权： EP06120612.4 20060914
- 主分类号： G01R31/3187
- IPC分类号： G01R31/3187
摘要：
The present invention relates to a method for performing a test case with at least one LBIST engine on an integrated circuit with a plurality of storage elements and logic circuits interconnected according to a predetermined scheme. The LBIST engine is at least partially built up by storage elements and/or logic circuits. At least one scan chain is formed as a series of selected storage elements and the other storage elements are used for the LBIST engine or a part of said LBIST engine in a testing mode. The scan chain is driven by a test pattern and the LBIST test case is testing those parts of the logic circuits corresponding to the storage elements of said scan chain.
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