发明申请
- 专利标题： Method and Apparatus for Improving Reliability of an Integrated Circuit Having Multiple Power Domains
- 专利标题（中）： 提高具有多个电源域的集成电路的可靠性的方法和装置
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申请号： US11535198申请日： 2006-09-26
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公开(公告)号： US20080074171A1公开(公告)日： 2008-03-27
- 发明人: Dipankar Bhattacharya , Makeshwar Kothandaraman , John C. Kriz , Bernard L. Morris , Yehuda Smooha
- 申请人： Dipankar Bhattacharya , Makeshwar Kothandaraman , John C. Kriz , Bernard L. Morris , Yehuda Smooha
- 主分类号： G05F1/10
- IPC分类号： G05F1/10
摘要：
An IC having improved reliability includes at least first and second circuit blocks and at least first and second power domains, the first circuit block being connected to the first power domain and the second circuit block being connected to the second power domain. The IC further includes at least one control circuit configured to generate at least first and second control signals. The first control signal is operative to selectively connect the first power domain to a first voltage supply, and the second control signal is operative to selectively connect the second power domain to a second voltage supply. The IC includes at least first and second clamp circuits, the first clamp circuit being connected to the first power domain, the second clamp circuit being connected to the second power domain. Each of the clamp circuits is operative to prevent a voltage on a corresponding power domain from rising above a prescribed voltage level for the corresponding power domain.