By correcting a data signal based on a current flowing through an EL element when an element driving transistor which controls a drive current to be supplied to the EL element is operated in a saturation region and the EL element is set to an emission level, it is possible to realize a rapid display variation inspection and a high precision display variation correction. By providing a current measuring function on an EL display apparatus, a characteristic variation after the apparatus is shipped can be handled and corrected.