A method and apparatus for embedding over-limit voltage detector and recording mechanisms on the silica wafer of integrated circuits to detect, protect and record voltage overages of pre-set voltage limits is presented. A detector circuit and a recorder circuit are placed in series or in parallel on the electrical connections between the integrated circuit devices and the voltage pins connected to outside power sources. When a voltage source is connected and an over-voltage condition is detected, the detector circuit short-circuits the connection while the recorder circuit records the event for later investigation.