发明申请
- 专利标题: ANALYZER
- 专利标题(中): 分析仪
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申请号: US11866595申请日: 2007-10-03
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公开(公告)号: US20080086666A1公开(公告)日: 2008-04-10
- 发明人: Makoto KAWAMURA , Yutaka OCHI , Yasunaga ISEDA , Hiroshi YAMAGUCHI
- 申请人: Makoto KAWAMURA , Yutaka OCHI , Yasunaga ISEDA , Hiroshi YAMAGUCHI
- 申请人地址: JP Osaka
- 专利权人: MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
- 当前专利权人: MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
- 当前专利权人地址: JP Osaka
- 优先权: JP2006-273964 20061005
- 主分类号: G06F11/25
- IPC分类号: G06F11/25 ; G06F11/22
摘要:
The analyzer according to the present invention is an analyzer having a scan test function, and including scan paths each having flip-flops which function as a shift register when a scan test is performed, and a switching unit operable to switch between a first connection state, and a second connection state where the scan paths are connected in series to each other and further an output from the last stage of the scan path is connected to the input of the first stage of the scan path.
公开/授权文献
- US07774666B2 Analyzer 公开/授权日:2010-08-10
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