Invention Application
- Patent Title: Semiconductor device and test system which output fuse cut information sequentially
- Patent Title (中): 输出保险丝切断信息的半导体器件和测试系统
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Application No.: US11605224Application Date: 2006-11-29
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Publication No.: US20080094071A1Publication Date: 2008-04-24
- Inventor: You-sang Lee , Jin-Yub Lee
- Applicant: You-sang Lee , Jin-Yub Lee
- Priority: KR10-2006-0101559 20061018
- Main IPC: G01R31/02
- IPC: G01R31/02

Abstract:
A semiconductor device includes a plurality of fuses, and a plurality of latch circuits respectively electrically connected to the plurality of fuses. The plurality of latch circuits are configured to store respective fuse-cut information from the plurality of fuses, and to then sequentially transmit the fuse-cut information through the latch circuits to output sequential data indicative of a fuse-cut state of the plurality of fuses.
Public/Granted literature
- US07511509B2 Semiconductor device and test system which output fuse cut information sequentially Public/Granted day:2009-03-31
Information query