Invention Application
US20080094071A1 Semiconductor device and test system which output fuse cut information sequentially 失效
输出保险丝切断信息的半导体器件和测试系统

  • Patent Title: Semiconductor device and test system which output fuse cut information sequentially
  • Patent Title (中): 输出保险丝切断信息的半导体器件和测试系统
  • Application No.: US11605224
    Application Date: 2006-11-29
  • Publication No.: US20080094071A1
    Publication Date: 2008-04-24
  • Inventor: You-sang LeeJin-Yub Lee
  • Applicant: You-sang LeeJin-Yub Lee
  • Priority: KR10-2006-0101559 20061018
  • Main IPC: G01R31/02
  • IPC: G01R31/02
Semiconductor device and test system which output fuse cut information sequentially
Abstract:
A semiconductor device includes a plurality of fuses, and a plurality of latch circuits respectively electrically connected to the plurality of fuses. The plurality of latch circuits are configured to store respective fuse-cut information from the plurality of fuses, and to then sequentially transmit the fuse-cut information through the latch circuits to output sequential data indicative of a fuse-cut state of the plurality of fuses.
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