Invention Application
US20080094469A1 Circuitry testing method and circuitry testing device 有权
电路测试方法和电路测试装置

Circuitry testing method and circuitry testing device
Abstract:
A circuitry testing method, comprising: providing a circuit board needing testing; applying a potential(160) to the circuit board needing testing so that the circuit board works and operating elements of the circuit board needing testing emit infrared rays; testing an intensity of radiation of the infrared rays using an infrared sensor(110); converting the radiation intensity to RGB(red, green, blue) data signals in order to form a diagnostic infrared image, using a processor(130); providing a standard infrared image; comparing the diagnostic infrared image with the standard infrared image; and determining whether the circuit board is defective according to the comparison.
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