Invention Application
- Patent Title: Circuitry testing method and circuitry testing device
- Patent Title (中): 电路测试方法和电路测试装置
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Application No.: US11821729Application Date: 2007-06-25
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Publication No.: US20080094469A1Publication Date: 2008-04-24
- Inventor: Shuo-Ting Yan
- Applicant: Shuo-Ting Yan
- Assignee: INNOLUX DISPLAY CORP.
- Current Assignee: INNOLUX DISPLAY CORP.
- Priority: TW95122734 20060623
- Main IPC: H04N5/33
- IPC: H04N5/33

Abstract:
A circuitry testing method, comprising: providing a circuit board needing testing; applying a potential(160) to the circuit board needing testing so that the circuit board works and operating elements of the circuit board needing testing emit infrared rays; testing an intensity of radiation of the infrared rays using an infrared sensor(110); converting the radiation intensity to RGB(red, green, blue) data signals in order to form a diagnostic infrared image, using a processor(130); providing a standard infrared image; comparing the diagnostic infrared image with the standard infrared image; and determining whether the circuit board is defective according to the comparison.
Public/Granted literature
- US08106946B2 Circuitry testing method and circuitry testing device Public/Granted day:2012-01-31
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