发明申请
- 专利标题: Autonomous Calibration for Optical Analysis System
- 专利标题(中): 光学分析系统的自动校准
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申请号: US11573799申请日: 2005-08-26
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公开(公告)号: US20080094623A1公开(公告)日: 2008-04-24
- 发明人: Frank Jeroen Pieter Schuurmans , Michael Cornelis Van Beek , Marjolein Van Der Voort
- 申请人: Frank Jeroen Pieter Schuurmans , Michael Cornelis Van Beek , Marjolein Van Der Voort
- 申请人地址: NL EINDHOVEN
- 专利权人: KONINKLIJKE PHILIPS ELECTRONICS N.V.
- 当前专利权人: KONINKLIJKE PHILIPS ELECTRONICS N.V.
- 当前专利权人地址: NL EINDHOVEN
- 优先权: EP04104085.8 20040826; IBPCT/IB05/52558 20050729
- 国际申请: PCT/IB05/52558 WO 20050826
- 主分类号: G01J3/457
- IPC分类号: G01J3/457 ; G01J3/04 ; G01R35/00
摘要:
The present invention provides an autonomous calibration of a multivariate based spectroscopic system that is preferably implemented as a multivariate based spectrometer. The spectroscopic system is based on a multivariate optical element that provides a spectral weighting of an incident optical signal. Spectral weighting is performed on the basis of spatial separation of spectral components and subsequent spatial filtering by means of a spatial light modulator. Calibration of the spectroscopic system is based on a dedicated calibration segment of the spatial light modulator, whose position corresponds to a characteristic calibration or reference wavelength of the incident optical signal. Preferably, the calibration or reference wavelength is given by the wavelength of the excitation radiation generated by the optical source that serves to induce scattering processes in a volume of interest.
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