发明申请
- 专利标题: Non-volatile memory device capable of reducing threshold voltage distribution
- 专利标题(中): 能够降低阈值电压分布的非易失性存储器件
-
申请号: US11636205申请日: 2006-12-09
-
公开(公告)号: US20080094923A1公开(公告)日: 2008-04-24
- 发明人: Wook-Hyun Kwon
- 申请人: Wook-Hyun Kwon
- 专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人: Samsung Electronics Co., Ltd.
- 优先权: KR2006-103053 20061023
- 主分类号: G11C7/00
- IPC分类号: G11C7/00
摘要:
A method for programming a flash memory device which includes a plurality of memory cells arranged in rows and columns. The method includes programming selected memory cells from among the plurality of memory cells according to loaded data bits. Data bits are read from the programmed selected memory cells. It is determined whether each of the programmed memory cells has been successfully programmed based on the results of the reading step. The programming of memory cells that have been determined to have been successfully programmed are inhibited. The programming, reading, determining and inhibiting steps are repeated until each of the selected memory cells has been determined to have been successfully programmed. A memory cell that has been previously determined to have been successfully programmed and inhibited is uninhibited and subsequently re-programmed when it is determined that the previously inhibited memory cell is no longer successfully programmed.
公开/授权文献
信息查询