发明申请
- 专利标题： Thickness variation detector of photoconductor, image formation unit, image formation apparatus and method for thickness variation of photoconductor
- 专利标题（中）： 光电导体的厚度变化检测器，成像单元，成像装置以及光电导体的厚度变化方法
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申请号： US11822811申请日： 2007-07-10
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公开(公告)号： US20080122460A1公开(公告)日： 2008-05-29
- 发明人: Junichi Ichikawa , Kenji Ogi , Masao Ito , Tomoshi Hara , Kenji Hara , Yoshifumi Takebe
- 申请人： Junichi Ichikawa , Kenji Ogi , Masao Ito , Tomoshi Hara , Kenji Hara , Yoshifumi Takebe
- 专利权人： Fuji Xerox Co., Ltd.
- 当前专利权人： Fuji Xerox Co., Ltd.
- 优先权： JPP.2006-318287 20061127
- 主分类号： G01B7/06
- IPC分类号： G01B7/06
摘要：
A thickness variation detector of a photoconductor includes: a current detection unit that detects a value of current being used for charging a surface of the photoconductor in a state in which a charging unit is in contact with a surface of the photoconductor; and a thickness variation detection unit that detects a thickness variation along a rotation direction of the photoconductor based on the value of current.