发明申请
- 专利标题： METHOD FOR ANALYZING THE DESIGN OF AN INTEGRATED CIRCUIT
- 专利标题（中）： 分析集成电路设计的方法
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申请号： US11611009申请日： 2006-12-14
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公开(公告)号： US20080147373A1公开(公告)日： 2008-06-19
- 发明人: Thomas Roessler , Markus Hofsaess
- 申请人： Thomas Roessler , Markus Hofsaess
- 主分类号： G06F17/50
- IPC分类号： G06F17/50
摘要：
According to one aspect, a method for analyzing the design of an integrated circuit comprises performing a simulation of the integrated circuit design to obtain simulation results and automatically associating the obtained simulation results to layout elements of the integrated circuit.
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