发明申请
- 专利标题: SINGLE MASK VIA METHOD AND DEVICE
- 专利标题(中): 通过方法和设备的单面罩
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申请号: US12045555申请日: 2008-03-10
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公开(公告)号: US20080150153A1公开(公告)日: 2008-06-26
- 发明人: Paul M. ENQUIST
- 申请人: Paul M. ENQUIST
- 申请人地址: US NC Morrisville
- 专利权人: Ziptronix, Inc.
- 当前专利权人: Ziptronix, Inc.
- 当前专利权人地址: US NC Morrisville
- 主分类号: H01L23/538
- IPC分类号: H01L23/538 ; H01L21/768
摘要:
A method of connecting elements such as semiconductor devices and a device having connected elements such as semiconductor devices. A first element having a first contact structure is bonded to a second element having a second contact structure. A single mask is used to form a via in the first element to expose the first contact and the second contact. The first contact structure is used as a mask to expose the second contact structure. A contact member is formed in contact with the first and second contact structures. The first contact structure may have an aperture or gap through which the first and second contact structures are connected. A back surface of the first contact structure may be exposed by the etching.
公开/授权文献
- US07714446B2 Single mask via method and device 公开/授权日:2010-05-11
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