Invention Application
- Patent Title: SYSTEM AND METHOD FOR TESTING VOLTAGE ENDURANCE
- Patent Title (中): 用于测试电压耐久性的系统和方法
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Application No.: US11836795Application Date: 2007-08-10
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Publication No.: US20080157788A1Publication Date: 2008-07-03
- Inventor: SHIH-FANG WONG , TSUNG-JEN CHUANG , JUN LI
- Applicant: SHIH-FANG WONG , TSUNG-JEN CHUANG , JUN LI
- Applicant Address: CN Shenzhen City TW Tu-Cheng
- Assignee: HONG FU JIN PRECISION INDUSTRY (Shenzhen) CO., LTD.,HON HAI PRECISION INDUSTRY CO., LTD.
- Current Assignee: HONG FU JIN PRECISION INDUSTRY (Shenzhen) CO., LTD.,HON HAI PRECISION INDUSTRY CO., LTD.
- Current Assignee Address: CN Shenzhen City TW Tu-Cheng
- Priority: CN200610157994.3 20061227
- Main IPC: G01R27/00
- IPC: G01R27/00
Abstract:
A method for testing voltage endurance of a electronic component, includes: generating an oscillating signal; amplifying the oscillating signal; transforming the amplified oscillating signal to generate a transformed signal; blocking a negative voltage of the transformed signal to generate a test signal to be transmitted to the electronic component; and detecting electrical characteristics of the electronic component to generate result data.
Public/Granted literature
- US07586315B2 System and method for testing voltage endurance Public/Granted day:2009-09-08
Information query
