发明申请
- 专利标题: METHOD FOR ENHANCING THE DIAGNOSTIC ACCURACY OF A VLSI CHIP
- 专利标题(中): 用于增强VLSI芯片诊断精度的方法
-
申请号: US11622055申请日: 2007-01-11
-
公开(公告)号: US20080172576A1公开(公告)日: 2008-07-17
- 发明人: Mary P. Kusko , Gary W. Maier , Franco Motika , Phong T. Tran
- 申请人: Mary P. Kusko , Gary W. Maier , Franco Motika , Phong T. Tran
- 申请人地址: US NY Armonk
- 专利权人: INTERNATIONAL BUSINESS MACHINES CORPORATION
- 当前专利权人: INTERNATIONAL BUSINESS MACHINES CORPORATION
- 当前专利权人地址: US NY Armonk
- 主分类号: G06F11/26
- IPC分类号: G06F11/26
摘要:
A diagnostic process applicable to VLSI designs to address the accuracy of diagnostic resolution. Environmentally based fail data drives adaptive test methods which hone the test pattern set and fail data collection for successful diagnostic resolution. Environmentally based fail data is used in diagnostic simulation to achieve a more accurate environmentally based fault callout. When needed, additional information is included in the process to further refine and define the simulation or callout result. Similarly, as needed adaptive test pattern generation methods are employed to result in enhanced diagnostic resolution.
公开/授权文献
- US07831863B2 Method for enhancing the diagnostic accuracy of a VLSI chip 公开/授权日:2010-11-09