发明申请
- 专利标题: Structure Monitor System
- 专利标题(中): 结构监控系统
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申请号: US10562922申请日: 2003-07-02
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公开(公告)号: US20080177482A1公开(公告)日: 2008-07-24
- 发明人: Kinzo Kishida , Motohiro Nakano , Yoshiaki Yamauchi
- 申请人: Kinzo Kishida , Motohiro Nakano , Yoshiaki Yamauchi
- 申请人地址: JP Kobe-shi, Hyogo
- 专利权人: Neubrex Co., Ltd.
- 当前专利权人: Neubrex Co., Ltd.
- 当前专利权人地址: JP Kobe-shi, Hyogo
- 国际申请: PCT/JP03/08395 WO 20030702
- 主分类号: G01B11/16
- IPC分类号: G01B11/16 ; G01D5/26 ; G01K11/00
摘要:
A structure monitor system comprising a measuring unit 3 for measuring distortions of the structure S at respective points on a boundary by using an optical fiber sensor 2 laid on the boundary of the structure, numerical analysis unit 5 for calculating a distortion at a specified point on the structure S by a numerical analysis method with distortions measured by the measuring unit as a boundary condition, and a display unit 6 for displaying information on an analysis distortion by the numerical analysis unit 5 in a association with a position on the structure S.
公开/授权文献
- US07542856B2 Structure monitor system 公开/授权日:2009-06-02
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