发明申请
- 专利标题: Electrical resistance measurement method and component inspection process
- 专利标题(中): 电阻测量方法和部件检查过程
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申请号: US11902323申请日: 2007-09-20
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公开(公告)号: US20080180115A1公开(公告)日: 2008-07-31
- 发明人: Yoshiaki Hiratsuka , Akio Ikeda , Masaharu Suzuki
- 申请人: Yoshiaki Hiratsuka , Akio Ikeda , Masaharu Suzuki
- 申请人地址: JP Kawasaki
- 专利权人: FUJITSU LIMITED
- 当前专利权人: FUJITSU LIMITED
- 当前专利权人地址: JP Kawasaki
- 优先权: JP2006-322949 20061130
- 主分类号: G01R27/02
- IPC分类号: G01R27/02
摘要:
An electrical resistance measurement method and a component inspection process to which the electrical resistance measurement method is applied. In the first step, a measuring object, for example, one pair of zinc-plated steel plates on which surfaces films are formed is prepared. Then, an elastic electroconductive material is sandwiched by the pair of zinc-plated steel plates and a spacer which regulates a space between the zinc-plated steel plates. Next, in the second step, an electrical resistance is measured in a state in which the pair zinc-plated steel plates sandwich the elastic electroconductive material.
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