A method and an article of manufacture are provided to monitor a temperature sensing circuit and detect a fault therein. The method comprises monitoring sensor readings output from a plurality of temperature sensing circuits. An average sensor reading is determined, calculated from the sensor readings output from a subset of the temperature sensing circuits. Each of the sensor readings is compared to the average sensor reading. A fault is identified when one of the sensor readings deviates from the average sensor reading by an amount greater than a threshold, more particularly when one of the sensor readings deviates from the average sensor reading by an amount greater than the threshold at least a quantity of X times out of Y sensor readings.