Invention Application
- Patent Title: Resonator Measurement Device and Method Employing the Device
- Patent Title (中): 谐振器测量装置和使用该装置的方法
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Application No.: US11722954Application Date: 2005-12-20
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Publication No.: US20080184804A1Publication Date: 2008-08-07
- Inventor: Bertrand Leverrier , Olivier Lefort
- Applicant: Bertrand Leverrier , Olivier Lefort
- Applicant Address: FR Neuilly Sur Seine
- Assignee: Thales
- Current Assignee: Thales
- Current Assignee Address: FR Neuilly Sur Seine
- Priority: FR0413965 20041227; FR0500591 20050120
- International Application: PCT/EP2005/056961 WO 20051220
- Main IPC: G01L11/04
- IPC: G01L11/04 ; G01N29/12 ; G01K11/22 ; G01P5/14 ; G01L27/00
Abstract:
The invention relates to a device and a method for detecting a fault in a measurement device comprising a resonator and means for measuring a resonant frequency of the resonator. According to the invention, the device further includes means delivering information (S3) representative of the quality factor of the resonator (3) at the resonant frequency.
Public/Granted literature
- US07798005B2 Resonator measurement device and method employing the device Public/Granted day:2010-09-21
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