发明申请
- 专利标题: KEY TESTING APPARATUS
- 专利标题(中): 主要测试设备
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申请号: US11945520申请日: 2007-11-27
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公开(公告)号: US20080184825A1公开(公告)日: 2008-08-07
- 发明人: LEI LI , PING CHEN , ZHI CHENG , JIAN-GUI WU , HONG-YAN LI , XUE-LIANG ZHAI , CHANG-FA SUN , YONG-ZHI TAO
- 申请人: LEI LI , PING CHEN , ZHI CHENG , JIAN-GUI WU , HONG-YAN LI , XUE-LIANG ZHAI , CHANG-FA SUN , YONG-ZHI TAO
- 申请人地址: CN ShenZhen City VG Tortola
- 专利权人: SHENZHEN FUTAIHONG PRECISION INDUSTRY CO., LTD.,SUTECH TRADING LIMITED
- 当前专利权人: SHENZHEN FUTAIHONG PRECISION INDUSTRY CO., LTD.,SUTECH TRADING LIMITED
- 当前专利权人地址: CN ShenZhen City VG Tortola
- 优先权: CN200710073196.7 20070202
- 主分类号: G01M19/00
- IPC分类号: G01M19/00
摘要:
A key testing apparatus (100) is provided. The key testing apparatus includes a base (11) and an actuator (12). The actuator includes a testing member (17) and a mounting member (18). The mounting member includes at least one base board (181) fixed to the base, a lower board (182), a mounting board (183), and a mounting sheet (185). The lower board is adjustably attached to the base board. The mounting board is adjustably attached to the lower board. The mounting sheet is adjustably attached to the mounting board. The clamping device includes a base desk (131), a clamping platform (132), at least one first clamping board (133) and second clamping board (134). The base desk is adjustably attached to the base. The clamping platform, at least one first clamping board, and at least one second clamping board are adjustably attached to the base desk.
公开/授权文献
- US07743676B2 Key testing apparatus 公开/授权日:2010-06-29
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