发明申请
- 专利标题: Ic Carrier, Ic Socket and Method for Testing Ic Device
- 专利标题(中): Ic载体,Ic插座和Ic器件测试方法
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申请号: US11886139申请日: 2005-03-11
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公开(公告)号: US20080191723A1公开(公告)日: 2008-08-14
- 发明人: Eichi Osato , Junichi Kasai , Kouichi Meguro , Masanori Onodera
- 申请人: Eichi Osato , Junichi Kasai , Kouichi Meguro , Masanori Onodera
- 申请人地址: JP Tokyo US CA Sunnyvale JP Aizuwakamatsu-shi
- 专利权人: Micronics Japan Co., Ltd.,SPANSION LLC,SPANSION Japan Limited
- 当前专利权人: Micronics Japan Co., Ltd.,SPANSION LLC,SPANSION Japan Limited
- 当前专利权人地址: JP Tokyo US CA Sunnyvale JP Aizuwakamatsu-shi
- 国际申请: PCT/JP05/04286 WO 20050311
- 主分类号: G01R31/02
- IPC分类号: G01R31/02 ; H05K7/00
摘要:
An IC device (10) held on an IC carrier (24) is a double-sided electrode type BGA IC device (10) provided with bump electrodes (14) on a first surface of a package. The IC device has, on a second surface opposite the first surface, (a) a central protrusion (30), (b) a peripheral portion (32) lower than the protrusion by one step, and (c) upper electrodes (18) formed on the peripheral portion of the IC device. The IC carrier is provided with a frame (36), a cover (40), and a holding means (42). The frame forms a device reception space (38) for receiving the IC device. The cover can cover the upper electrodes while in contact with the periphery of the IC device held on the IC carrier. The holding means can hold the IC device on the IC carrier with the cover covering the upper electrodes of the IC device. The IC device can be set in an IC socket while being mounted on the IC carrier.
公开/授权文献
- US07884630B2 IC carrie, IC socket and method for testing IC device 公开/授权日:2011-02-08
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