发明申请
- 专利标题: Sensor semiconductor device and manufacturing method thereof
- 专利标题(中): 传感器半导体器件及其制造方法
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申请号: US12070003申请日: 2008-02-14
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公开(公告)号: US20080197438A1公开(公告)日: 2008-08-21
- 发明人: Chang-Yueh Chan , Chien-Ping Huang , Tse-Wen Chang , Chih-Ming Huang , Cheng-Hsu Hsiao
- 申请人: Chang-Yueh Chan , Chien-Ping Huang , Tse-Wen Chang , Chih-Ming Huang , Cheng-Hsu Hsiao
- 申请人地址: TW Taichung
- 专利权人: Siliconware Precision Industries Co., Ltd.
- 当前专利权人: Siliconware Precision Industries Co., Ltd.
- 当前专利权人地址: TW Taichung
- 优先权: TW096106007 20070216
- 主分类号: H01L31/0203
- IPC分类号: H01L31/0203 ; H01L31/18
摘要:
This invention discloses a sensor semiconductor device and a manufacturing method thereof, including: providing a wafer having a plurality of sensor chips, forming a plurality of grooves between bond pads on active surfaces of the adjacent sensor chips; forming conductive traces in the grooves for electrically connecting the bond pads; mounting a transparent medium on the wafer for covering sensing areas of the sensor chips; thinning the sensor chips from the non-active surfaces down to the grooves, thereby exposing the conductive traces; cutting the wafer to separate the sensor chips; mounting the sensor chips on a substrate module having a plurality of substrates, electrically connecting the conductive traces to the substrates; providing an insulation material on the substrate module and between the sensor chips so as to encapsulate the sensor chips but expose the transparent medium; and cutting the substrate module to separate a plurality of resultant sensor semiconductor devices.
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