发明申请
- 专利标题: Integrated test method on multi-operating system platform
- 专利标题(中): 多操作系统平台集成测试方法
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申请号: US11707871申请日: 2007-02-20
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公开(公告)号: US20080201610A1公开(公告)日: 2008-08-21
- 发明人: Town Chen , Kai Wang , Tom Chen , Win-Harn Liu
- 申请人: Town Chen , Kai Wang , Tom Chen , Win-Harn Liu
- 申请人地址: TW Taipei
- 专利权人: INVENTEC CORPORATION
- 当前专利权人: INVENTEC CORPORATION
- 当前专利权人地址: TW Taipei
- 主分类号: G06F11/00
- IPC分类号: G06F11/00
摘要:
An integrated test method on a multi-operation system (OS) platform for performing an integrated test of a file system and disk performance in a computer with an extended firmware interface (EFI) system environment on multiple OS platforms is provided. The method includes the following steps. Scan sectors of an entire physical hard disk and perform a hardware underlying test of a disk device in the EFI environment; select and load an OS, then enter the OS environment to test the file system and the disk performance in the system environment; exit from the OS and return to the EFI environment to summarize a test result; determine whether it is necessary to load other OSes, if necessary, return and load other OSes, and if not, send the summarized test result to a server terminal for analysis and processing.
公开/授权文献
- US07574624B2 Integrated test method on multi-operating system platform 公开/授权日:2009-08-11
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