Invention Application
- Patent Title: Capacitance Measurement Apparatus and Method
- Patent Title (中): 电容测量装置及方法
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Application No.: US12115672Application Date: 2008-05-06
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Publication No.: US20080204046A1Publication Date: 2008-08-28
- Inventor: James E. Bartling
- Applicant: James E. Bartling
- Assignee: Microchip Technology Incorporated
- Current Assignee: Microchip Technology Incorporated
- Main IPC: G01R27/26
- IPC: G01R27/26

Abstract:
A time period of an event is determined by charging a known value capacitor from a constant current source during the event. The resultant voltage on the capacitor is proportional to the event time period and may be calculated from the resultant voltage and known capacitance value. Capacitance is measured by charging a capacitor from a constant current source during a known time period. The resultant voltage on the capacitor is proportional to the capacitance thereof and may be calculated from the resultant voltage and known time period. A long time period event may be measured by charging a first capacitor at the start of the event and a second capacitor at the end of the event, while counting clock times therebetween. Delay of an event is done by charging voltages on first and second capacitors at beginning and end of event, while comparing voltages thereon with a reference voltage.
Public/Granted literature
- US08022714B2 Capacitance measurement apparatus Public/Granted day:2011-09-20
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