发明申请
- 专利标题： Method of measuring landed dot, measuring apparatus for landed dot, liquid droplet ejection apparatus, method of manufacturing electro-optic apparatus, electro-optic apparatus, and electronic apparatus
- 专利标题（中）： 测量着陆点的方法，着陆点测量装置，液滴喷射装置，电光装置的制造方法，电光装置和电子装置
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申请号： US12012765申请日： 2008-02-05
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公开(公告)号： US20080204502A1公开(公告)日： 2008-08-28
- 发明人: Hirofumi Sakai
- 申请人： Hirofumi Sakai
- 专利权人： Seiko Epson Corporation
- 当前专利权人： Seiko Epson Corporation
- 优先权： JP2007-045743 20070226
- 主分类号： B41J29/393
- IPC分类号： B41J29/393
摘要：
A landed dot measuring method in which a topology measuring apparatus having an interferometer measures topology of a landed dot which is a functional liquid droplet landed on an inspection sheet when an inspection ejection for a functional liquid droplet ejection head is performed including: inspection-ejecting in which multiple ejection nozzles of a functional liquid droplet ejection head inspection-eject one by one at a time interval while the functional liquid droplet ejection head is moved in a main scanning direction relatively with respect to the inspection sheet and; and measuring in which respective topologies of multiple landed dots are measured while the topology measuring apparatus follows the functional liquid droplet ejection head and moves in the main scanning direction at a same speed as the functional liquid droplet ejection head relatively with respect to the inspection sheet.
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