发明申请
- 专利标题: Fluorescence Microscope and Fluorescence Microscope Method
- 专利标题(中): 荧光显微镜和荧光显微镜法
-
申请号: US11792304申请日: 2005-10-14
-
公开(公告)号: US20080215272A1公开(公告)日: 2008-09-04
- 发明人: Katsumasa Fujita , Satoshi Kawata , Naoko Nakamura , Osamu Nakamura , Minoru Kobayashi
- 申请人: Katsumasa Fujita , Satoshi Kawata , Naoko Nakamura , Osamu Nakamura , Minoru Kobayashi
- 优先权: JP2004-355483 20041208
- 国际申请: PCT/JP05/18945 WO 20051014
- 主分类号: G06F15/00
- IPC分类号: G06F15/00
摘要:
To increase spatial resolution by observing a sample based on saturated fluorescence components. A fluorescence microscope according to the present invention includes: a laser light source 10 emitting laser light as excitation light; an objective lens 13 focusing the laser light and applying the focused laser light to a sample 14; a detector 22 detecting fluorescence generated in the sample 14 with the laser light; and a stage 15 scanning the sample 14 while moving the sample 14 relative to the laser light, wherein the laser light is applied to the sample with varying intensities such that saturation of fluorescence occurs at the maximum intensity of the laser light, and fluorescence is detected with the detector in accordance with intensity of the laser light, and the sample is observed based on the saturation components of fluorescence.
公开/授权文献
信息查询