Invention Application
- Patent Title: Image Analysis System and Image Analysis Method
- Patent Title (中): 图像分析系统和图像分析方法
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Application No.: US12043164Application Date: 2008-03-06
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Publication No.: US20080225131A1Publication Date: 2008-09-18
- Inventor: Masaru Aoki
- Applicant: Masaru Aoki
- Applicant Address: JP Tokyo
- Assignee: NEC CORPORATION
- Current Assignee: NEC CORPORATION
- Current Assignee Address: JP Tokyo
- Priority: JP2007-066643 20070315
- Main IPC: H04N5/28
- IPC: H04N5/28
![Image Analysis System and Image Analysis Method](/abs-image/US/2008/09/18/US20080225131A1/abs.jpg.150x150.jpg)
Abstract:
An image analysis system includes a camera which captures an image of a monitor object, a mirror mounted at a predetermined angle within a visual field of the camera so as to form an image of the monitor object viewed from a direction different from a capturing direction of the camera, and a data processing apparatus which monitors a change in the monitor object by segmenting an image captured by the camera into an image on the mirror and an image except the image on the mirror and separately analyzing the image on the mirror and the image except the image on the mirror. An image analysis method is also disclosed.
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