发明申请
- 专利标题： CIRCUIT ABNORMALITY DETERMINING APPARATUS AND METHOD
- 专利标题（中）： 电路异常判定装置及方法
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申请号： US12041019申请日： 2008-03-03
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公开(公告)号： US20080232015A1公开(公告)日： 2008-09-25
- 发明人: Katsuhiko WAKABAYASHI , Akihiro Sato , Toshiyuki Innami , Hitoshi Kobayashi
- 申请人： Katsuhiko WAKABAYASHI , Akihiro Sato , Toshiyuki Innami , Hitoshi Kobayashi
- 专利权人： HITACHI, LTD.
- 当前专利权人： HITACHI, LTD.
- 优先权： JP2007-073851 20070322
- 主分类号： H02H3/00
- IPC分类号： H02H3/00
摘要：
In circuit abnormality determining apparatus and method applicable to a brake control apparatus, an abnormality determining section determines at least one of an abnormality location of the electric circuit and an abnormality kind of the electric circuit on a basis of monitoring results of a current state in the electric circuit detected by a current detection section, a voltage state of the electric circuit detected by a open circuit detection section, and a power supply voltage.
信息查询
