发明申请
- 专利标题: Ion source and mass spectrometer instrument using the same
- 专利标题(中): 离子源和质谱仪使用相同
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申请号: US12081625申请日: 2008-04-18
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公开(公告)号: US20080237459A1公开(公告)日: 2008-10-02
- 发明人: Atsumu Hirabayashi , Minoru Sakairi , Yasuaki Takada , Hideaki Koizumi , Kaoru Umemura
- 申请人: Atsumu Hirabayashi , Minoru Sakairi , Yasuaki Takada , Hideaki Koizumi , Kaoru Umemura
- 优先权: JP6-043523 19940315; JP6-201767 19940826
- 主分类号: B01D59/44
- IPC分类号: B01D59/44
摘要:
An ion source includes a body having a gas passage and an orifice. A capillary is inserted into the gas passage so that a tip portion of the capillary extends into the orifice. A gas supplier supplies a gas into the gas passage to form a gas flow through the gas passage along the capillary and through the orifice past a tip of the capillary so that the gas flow sprays a sample solution flowing through the capillary from the tip of the capillary. A flow controller regulates a pressure of the gas in the gas passage to adjust a characteristic value F/S to a predetermined value, where F is a flow rate of the gas flow at standard conditions (20.degree. C., 1 atmosphere), and S is a difference between a cross section of the orifice and a cross section of the tip portion of the capillary in the orifice.