发明申请
- 专利标题: On-Chip Estimation of Key-Extraction Parameters for Physical Tokens
- 专利标题(中): 物理令牌关键提取参数的片上估计
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申请号: US12097584申请日: 2006-12-12
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公开(公告)号: US20080262788A1公开(公告)日: 2008-10-23
- 发明人: Geert Jan Schrijen , Boris Skoric
- 申请人: Geert Jan Schrijen , Boris Skoric
- 申请人地址: NL Eindhoven
- 专利权人: NXP B.V.
- 当前专利权人: NXP B.V.
- 当前专利权人地址: NL Eindhoven
- 优先权: EP05112117.6 20051214
- 国际申请: PCT/IB2006/054758 WO 20061212
- 主分类号: G01B21/00
- IPC分类号: G01B21/00
摘要:
The present invention relates to a method and a device (11) using a physical token (14), which provides measurable parameters, to derive at least one data set. A plurality of values of one or more of the parameters are measured. From these measured values, a measure of variance is calculated. Quantization intervals into which a measured value is to be quantized are then determined. A possible value of a data set, which subsequently can be derived from a measured value provided by the physical token, is associated with each quantization interval. Further, information which subsequently enables determination of these quantization intervals is stored. Hence, an enrolling phase has been completed. When the preparing phase has been completed, a deriving phase may commence. When a data set is to be derived, for example to be used as a cryptographic key, a value of any one of the parameters provided by the PUF is measured. This measured value is quantized into a determined quantization interval, and a data set may be derived from the quantization interval into which the measured value is quantized.
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