发明申请
US20080265385A1 Semiconductor package using copper wires and wire bonding method for the same
审中-公开
半导体封装采用铜线和引线接合方式相同
- 专利标题: Semiconductor package using copper wires and wire bonding method for the same
- 专利标题(中): 半导体封装采用铜线和引线接合方式相同
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申请号: US12215543申请日: 2008-06-27
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公开(公告)号: US20080265385A1公开(公告)日: 2008-10-30
- 发明人: Han-Lung Tsai , Chih-Ming Huang , Cheng-Hsu Hsiao
- 申请人: Han-Lung Tsai , Chih-Ming Huang , Cheng-Hsu Hsiao
- 申请人地址: TW Taichung
- 专利权人: Siliconware Precision Industries Co., Ltd.
- 当前专利权人: Siliconware Precision Industries Co., Ltd.
- 当前专利权人地址: TW Taichung
- 优先权: TW096112654 20070411; TW096123660 20070629
- 主分类号: H01L21/60
- IPC分类号: H01L21/60 ; H01L23/495
摘要:
A semiconductor package using copper wires and a wire bonding method for the same are proposed. The package includes a carrier having fingers and a chip mounted on the carrier. The method includes implanting stud bumps on the fingers of the carrier and electrically connecting the chip and the carrier by copper wires with one ends of the copper wires being bonded to bond pads of the chip and the other ends of the copper wires being bonded to the stud bumps on the carrier. The implanted stud bumps on the carrier improve bondability of the copper wires to the carrier and thus prevent stitch lift. With good bonding, residues of copper wires left behind after a bonding process have even tail ends and uniform tail length to enable fabrication of solder balls of uniform size, thereby eliminating a conventional step of implanting stud bumps on the bond pads of chips and preventing ball lift from occurring.
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IPC分类: