发明申请
- 专利标题: SPECIFIC ABSORPTION RATE MEASUREMENT SYSTEM AND METHOD
- 专利标题(中): 具体的吸收率测量系统和方法
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申请号: US11873934申请日: 2007-10-17
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公开(公告)号: US20080265902A1公开(公告)日: 2008-10-30
- 发明人: Katsuki KIMINAMI , Takahiro Iyama , Teruo Onishi
- 申请人: Katsuki KIMINAMI , Takahiro Iyama , Teruo Onishi
- 申请人地址: JP Chiyoda-ku
- 专利权人: NTT DoCoMo, Inc.
- 当前专利权人: NTT DoCoMo, Inc.
- 当前专利权人地址: JP Chiyoda-ku
- 优先权: JP2006-287607 20061023; JP2007-113533 20070423
- 主分类号: G01R29/08
- IPC分类号: G01R29/08 ; G01R29/12
摘要:
A disclosed specific absorption rate measurement system according to an embodiment of the present invention measures a specific absorption rate of electromagnetic waves from a radiating source absorbed in a dielectric medium. The system includes a measurement portion that measures a first electric field vector on an observation surface which is a two-dimensional surface in the dielectric medium; an electric field calculation portion that calculates a second electric field vector in a point excluded from the observation surface in accordance with electric field components of the first electric field vector measured on the observation surface, the electric field components being parallel to the observation surface; and a calculation portion that calculates the specific absorption rate from the calculated second electric field vector.
公开/授权文献
- US07683632B2 Specific absorption rate measurement system and method 公开/授权日:2010-03-23