发明申请
US20080266733A1 Circuit Testing Closer Apparatus and Method With In-Rush Current Awareness
有权
具有冲击电流意识的电路测试更接近装置和方法
- 专利标题: Circuit Testing Closer Apparatus and Method With In-Rush Current Awareness
- 专利标题(中): 具有冲击电流意识的电路测试更接近装置和方法
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申请号: US12091341申请日: 2006-10-03
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公开(公告)号: US20080266733A1公开(公告)日: 2008-10-30
- 发明人: Raymond P. O'Leary , Christopher R. Lettow , Alejandro Montenegro , John C. Opfer
- 申请人: Raymond P. O'Leary , Christopher R. Lettow , Alejandro Montenegro , John C. Opfer
- 申请人地址: US IL Chicago
- 专利权人: S & C ELECTRIC CO.
- 当前专利权人: S & C ELECTRIC CO.
- 当前专利权人地址: US IL Chicago
- 国际申请: PCT/US06/38472 WO 20061003
- 主分类号: H02H3/06
- IPC分类号: H02H3/06
摘要:
A circuit testing closer is capable of closing a power distribution circuit and interrupting the resulting current at the next current zero. Upon detecting a fault, the circuit testing closer is operable to open contacts to isolate the fault. Next, the circuit testing closer tests the faulted line to determine whether the fault has cleared. The circuit testing closer may generate a first test signal having a first polarity and a second test signal having a second polarity opposite the first polarity. Generation of the second test signal may be limited to occur when the first test signal indicates a fault.
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