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发明申请
US20080266942A1 Multiple level cell phase-change memory device having pre-reading operation resistance drift recovery, memory systems employing such devices and methods of reading memory devices 有权
具有预读取操作电阻漂移恢复的多电平单元相变存储器件，采用这种器件的存储器系统以及读取存储器件的方法

Multiple level cell phase-change memory device having pre-reading operation resistance drift recovery, memory systems employing such devices and methods of reading memory devices
摘要：
A memory device comprises a plurality of memory cells, each memory cell comprising a memory cell material that has an initial resistance that is determined in response to an applied programming current in a programming operation, the resistance of the memory cell varying from the initial resistance over a time period following the programming operation, and each memory cell being connected to a conduction line of the memory device that is used to apply the programming current to program the resistance of the corresponding memory cell in the programming operation and that is used to apply a read current to read the resistance of the corresponding memory cell in a read operation. A modification circuit modifies the resistance of a memory cell of the plurality of memory cells selected for a read operation to return its resistance to near the initial resistance prior to a read operation of the memory cell.
摘要（中）：

存储器件包括多个存储器单元，每个存储器单元包括存储单元材料，该存储单元材料具有响应于编程操作中所施加的编程电流而确定的初始电阻，存储单元的电阻从初始电阻变化 编程操作之后的时间段，并且每个存储器单元连接到存储器件的传导线，其用于在编程操作中应用编程电流来对相应的存储器单元的电阻进行编程，并且用于应用编程 读取电流以读取读取操作中的相应存储单元的电阻。 修改电路修改为读取操作选择的多个存储单元的存储单元的电阻，以在存储单元的读取操作之前将其电阻返回到接近初始电阻。

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