发明申请
- 专利标题: MOS devices having elevated source/drain regions
- 专利标题(中): 具有升高的源极/漏极区域的MOS器件
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申请号: US11800615申请日: 2007-05-07
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公开(公告)号: US20080277735A1公开(公告)日: 2008-11-13
- 发明人: Chih-Hsin Ko , Hung-Wei Chen , Chung-Hu Ke , Ta-Ming Kuan , Wen-Chin Lee
- 申请人: Chih-Hsin Ko , Hung-Wei Chen , Chung-Hu Ke , Ta-Ming Kuan , Wen-Chin Lee
- 主分类号: H01L29/417
- IPC分类号: H01L29/417 ; H01L27/092 ; H01L29/78
摘要:
A semiconductor structure includes a semiconductor substrate; a gate dielectric over the semiconductor substrate; a gate electrode over the gate dielectric; a deep source/drain region adjacent the gate electrode; a silicide region over the deep source/drain region; and an elevated metallized source/drain region between the silicide region and the gate electrode. The elevated metallized source/drain region adjoins the silicide region.
公开/授权文献
- US08569837B2 MOS devices having elevated source/drain regions 公开/授权日:2013-10-29
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