发明申请
- 专利标题: Optical Signal Quality Monitoring Circuit and Optical Signal Quality Monitoring Method
- 专利标题(中): 光信号质量监测电路和光信号质量监测方法
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申请号: US10585532申请日: 2005-06-03
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公开(公告)号: US20080285970A1公开(公告)日: 2008-11-20
- 发明人: Ippei Shake , Hidehiko Takara , Atsushi Taniguchi
- 申请人: Ippei Shake , Hidehiko Takara , Atsushi Taniguchi
- 申请人地址: JP Tokyo
- 专利权人: Nippon Telegraph and Telephone Corporation
- 当前专利权人: Nippon Telegraph and Telephone Corporation
- 当前专利权人地址: JP Tokyo
- 优先权: JP2004-166453 20040603
- 国际申请: PCT/JP2005/010224 WO 20050603
- 主分类号: H04B10/08
- IPC分类号: H04B10/08 ; H04B10/00 ; H04B17/00
摘要:
The present invention provides an optical signal quality monitoring circuit and an optical signal quality monitoring method for measuring correct optical signal quality parameters when a signal bit rate is changed. The optical signal quality monitoring circuit which samples and converts an electrical signal converted from an optical signal with a given repeated frequency f1 to digital sampling data through an analog to digital conversion, thereafter, evaluates an optical signal quality parameter of the optical signal by subjecting sampling data to electrical signal processing in an integrated circuit in which a signal processing function is programmed, receives a control signal notifying that the bit rate of the optical signal is changed, or detects that the bit rate of the optical signal is changed to correct optical the signal quality parameter of the optical signal corresponding to the signal bit rate of the optical signal which is changed.
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