发明申请
- 专利标题: Sequential regression for calibration from residues
- 专利标题(中): 从残留物进行校准的顺序回归
-
申请号: US11818801申请日: 2007-06-14
-
公开(公告)号: US20080309767A1公开(公告)日: 2008-12-18
- 发明人: Alexander Berestov , Kenichi Nishio , Ted J. Cooper , Masaya Kinoshita , Ting Zhang
- 申请人: Alexander Berestov , Kenichi Nishio , Ted J. Cooper , Masaya Kinoshita , Ting Zhang
- 专利权人: Sony Corporation and Sony Electronics Inc.
- 当前专利权人: Sony Corporation and Sony Electronics Inc.
- 主分类号: H04N5/225
- IPC分类号: H04N5/225 ; H04N17/00 ; H04N17/02
摘要:
A system for and method of calibrating an imaging device efficiently is described herein. The imaging device acquires an image of an object that is more than one color. The information acquired is then transferred to a computing device. The information is then used to generate a set of data which represents information which was not acquired in the image. The set of data is generated based on statistical prediction using a training data set. Using acquired image information and the set of data, an imaging device is able to be calibrated. Since the process of calibration utilizing this method only requires one image to be acquired and a reduced set of image information to be sent to the computing device, the process is more efficient than previous implementations.
公开/授权文献
- US07847822B2 Sequential regression for calibration from residues 公开/授权日:2010-12-07
信息查询